kw.\*:("Microscopía emisión campo")
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Field emission 2000: proceedings of the 46th International Field Emission Symposium, Pittsburgh, PA, USA, 23-28 July 2000DANOIX, F; SEIDMAN, D. N.Ultramicroscopy. 2001, Vol 89, Num 1-3, issn 0304-3991, 220 p.Conference Proceedings
Reproducibility of scanning tunneling spectroscopy of Si(111)7 × 7 using a build-up tipTOMITORI, M; SUGATA, K; OKUYAMA, G et al.Surface science. 1996, Vol 355, Num 1-3, pp 21-30, issn 0039-6028Article
On the early history of field emission including attempts of tunneling spectroscopyKLEINT, C.Progress in surface science. 1993, Vol 42, Num 1-4, pp 101-115, issn 0079-6816Conference Paper
High resolution imaging and analysis of grain boundaries in steel using a field emission auger microprobeWALMSLEY, J. C; JONES, G; LEE, B. J et al.Applied surface science. 1997, Vol 108, Num 2, pp 289-295, issn 0169-4332Article
Expected contribution of the field-emission gun to high-resolution transmission electron microscopyZEMLIN, F.Micron (1993). 1994, Vol 25, Num 3, pp 223-226, issn 0968-4328Article
Sub-nanometer resolution 300-kV analytical field-emission transmission electron microscopeMURAKOSHI, H; ICHIHASHI, M; KAKIBAYASHI, H et al.Hitachi review. 1996, Vol 45, Num 1, pp 11-14, issn 0018-277XArticle
Fabrication of multilayered nanotube probe tipsKLECKLEY, S; CHAI, G. Y; ZHOU, D et al.Carbon (New York, NY). 2003, Vol 41, Num 4, pp 833-836, issn 0008-6223, 4 p.Article
Analysis of fiber probes of scanning near-field optical microscope by field emission microscopySEKATSKII, S. K; MIRONOV, B. N; LAPSHIN, D. A et al.Ultramicroscopy. 2001, Vol 89, Num 1-3, pp 83-87, issn 0304-3991Conference Paper
Cryo field emission scanning electron microscopyERLANDSEN, Stanley L; OTTENWAELTER, Cecile; FRETHEM, Chris et al.BioTechniques. 2001, Vol 31, Num 2, pp 300-305, issn 0736-6205, 5 p.Article
Field Emission '97 International Field Emission SymposiumHONO, K; TSUKADA, M.Ultramicroscopy. 1998, Vol 73, Num 1-4, issn 0304-3991, 305 p.Conference Proceedings
Method of calculating the number of active emitters in a multipoint systemZHUKOV, V. M; YEGOROV, N. V.Journal of communications technology & electronics. 1993, Vol 38, Num 8, pp 63-67, issn 1064-2269Article
High-field corrosion observed in a field ion microscopic study = Corrosion en champ fort observée dans une étude de microscopie ionique à émission de champRAMANATHAN, D; VIJENDRAN, P.Journal de physique. Colloques. 1986, Vol 47, Num 7, pp 425-428, issn 0449-1947Conference Paper
Field emission from diamond particles studied by scanning field emission microscopyWATANABE, Akihiko; DEGUCHI, Masahiro; KITABATAKE, Makoto et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 145-151, issn 0304-3991, 7 p.Conference Paper
Localization of the polymer phase in bitumen/polymer blends by field emission cryo-scanning electron microscopyWILSON, A; FUCHS, G; SCRAMONCIN, C et al.Energy & fuels. 2000, Vol 14, Num 3, pp 575-584, issn 0887-0624Article
Control of emission current from a Li/W <111> field emitter by sequential deposition of LiHATA, K; AKAHORI, H; TAKEMOTO, T et al.Applied surface science. 1999, Vol 146, Num 1-4, pp 387-390, issn 0169-4332Conference Paper
A miniature, all-electrostatic, field emission electron column for surface analytical microscopyROBERTS, R. H; EL GOMATI, M. M; KUDJOE, J et al.Measurement science & technology (Print). 1997, Vol 8, Num 5, pp 536-545, issn 0957-0233Article
Field emission current from Si tip: ultra-fast time resolved measurementsHIRAYAMA, Satoshi; WATANABE, Fumiya; TAKAHASHI, Toshinori et al.Surface science. 2002, Vol 515, Num 2-3, pp 369-376, issn 0039-6028Article
Coherent electron emission from carbon nanotubes. Young's interference in the emission patternsYAMASHITA, T; MASTUDA, K; KONA, T et al.Surface science. 2002, Vol 514, Num 1-3, pp 283-290, issn 0039-6028Conference Paper
Field Emission '98 Proceedings of the 45th Internatonal Field Emission SymposiumMOUSA, M. S; DANOIX, F.Ultramicroscopy. 1999, Vol 79, Num 1-4, issn 0304-3991, 317 p.Conference Proceedings
A new concept of theoretical resolution of an optical system, comparison with experiment and optimum condition for a point sourceSATO, M; ORLOFF, J.Ultramicroscopy. 1992, Vol 41, Num 1-3, pp 181-192, issn 0304-3991Article
Spin-polarized secondary electrons from a scanning tunneling microscope in field emission modeALLENSPACH, R; BISCHOF, A.Applied physics letters. 1989, Vol 54, Num 6, pp 587-589, issn 0003-6951, 3 p.Article
VLS-like growth and characterizations of dense ZnO nanorods grown by e-beam processAGARWAL, D. C; CHAUHAN, R. S; PELLEGRINI, G et al.Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 3, issn 0022-3727, 035310.1-035310.6Article
Electrochemical nanoelectrodes for advanced investigations of nanostructuresHUGELMANN, Philipp; HUGELMANN, Martin; SCHINDLER, Werner et al.Journal of electroanalytical chemistry (1992). 2008, Vol 612, Num 1, pp 131-139, issn 1572-6657, 9 p.Article
Electron Field Emission and Photoluminescence of Anatase Nanotube ArraysYANG YANG; XIAOHUI WANG; CHANGKU SUN et al.Journal of the American Ceramic Society. 2008, Vol 91, Num 12, pp 4109-4111, issn 0002-7820, 3 p.Article
Microstructure Characterisation of Electrical Discharge Craters using FIB/SEM Dual Beam TechniquesJEANVOINE, Nicolas; HOLZAPFEL, Christian; SOLDERA, Flavio et al.Advanced engineering materials (Print). 2008, Vol 10, Num 10, issn 1438-1656, 901, 973-977 [6 p.]Article